本所声明  |  联系方式  |  中国科学院  |  数字认证(OA)   |  ARP  |  English  |  邮箱

标题: Band alignment of AlN/beta-Ga2O3 heterojunction interface measured by x-ray photoelectron spectroscopy
作者: ChenJin-Xin;TaoJia-Jia;MaHong-Ping;ZhangHao;FengJi-Jun;LiuWen-Jun;XiaChangtai;LuHong-Liang;ZhangDavidWei
论文类型: 期刊论文
期刊/会议名称: APPLIED PHYSICS LETTERS
年: 2018
卷: 112
期: 26