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标题: Back focal plane imaging for light emission from a tunneling junction in a low-temperature ultrahigh-vacuum scanning tunneling microscope
作者: Yu, Yun-Jie; Kuai, Yan; Fan, Yong-Tao; Zhu, Liang-Fu; Kong, Fan-Fang; Tian, Xiao-Jun; Jing, Shi-Hao; Zhang, Li; Zhang, Dou-Guo; Zhang, Yao; Zhang, Yang; Dong, Zhen-Chao
论文类型: 期刊论文
期刊/会议名称: REVIEW OF SCIENTIFIC INSTRUMENTS
年: 2023
卷: 94
期: 6